"Electromigrations" Example Sentences
1. Electromigrations are responsible for the degradation of electronic devices.
2. To prevent electromigrations, engineers implement rigorous testing protocols.
3. Electromigrations can be a major issue in microchip manufacturing.
4. The efficiency of electronic devices can be improved by reducing electromigrations.
5. Electromigration is a field of study within electronic engineering.
6. The atomic structure of materials plays a role in determining the extent of electromigrations.
7. The incidence of electromigrations can be reduced by using higher quality materials.
8. Electromigration can cause short circuits to occur within electronic devices.
9. Electromigration can also cause the formation of voids within materials.
10. It is important to understand the fundamental physics behind electromigrations.
11. Nanotechnology has potential for minimizing electromigrations in electronic devices.
12. Electromigrations can lead to device failure if left undetected.
13. Certain metals are more susceptible to electromigrations than others.
14. Electromigrations can occur due to stress placed on materials during the manufacturing process.
15. Electromigrations can cause the physical structure of materials to change over time.
16. The rate of electromigrations can be affected by temperature and voltage.
17. Electromigrations can be modeled and simulated using computer software.
18. It is important to monitor and control electromigrations in order to prolong the lifespan of electronic devices.
19. Electromigration is a critical issue in the design of integrated circuits.
20. Advances in materials science have led to new ways of mitigating the effects of electromigrations.
21. Electromigrations can be minimized by using advanced manufacturing techniques.
22. Understanding the behavior of electromigrations is crucial for developing new electronic devices.
23. Electromigrations can be caused by a variety of factors, including structural defects and impurities.
24. The study of electromigration is constantly evolving as new technologies emerge.
25. Electronic devices with a high density of components are particularly susceptible to electromigrations.
26. Electromigrations can be categorized into different types based on their characteristics.
27. Improving the reliability of electronic devices requires a deep understanding of electromigration.
28. Electromigration testing is a key part of device validation and certification.
29. Electromigrations can cause fluctuations in current and voltage, which can negatively impact performance.
30. The effects of electromigration can be mitigated by using specialized coatings on electronic components.
31. The presence of foreign substances within materials can exacerbate the effects of electromigration.
32. Electromigration can also be influenced by the size and shape of electronic components.
33. Electromigrations can occur due to both external and internal factors.
34. Research into electromigration is essential for the advancement of electronic engineering.
35. Electromigrations can be monitored using specialized electrical measurement equipment.
36. Electromigration can cause physical changes in materials, such as the formation of hillocks and whiskers.
37. Preventing electromigrations is a key challenge in the design of microscale electronic devices.
38. The rate of electromigration can increase with higher voltages and frequencies.
39. Advances in nanomaterials have led to improved resistance to electromigrations.
40. Electromigrations can be minimized by optimizing the layout and design of electronic devices.
Common Phases
Electromigration is a phenomenon that occurs due to the movement of atoms caused by an electric current;
Electromigrations can cause changes in the composition and morphology of conducting thin films; It can also cause failure in microelectronic devices; Electromigration can be mitigated by using materials that have a higher resistance to it; However, these materials tend to be more expensive; Thus, there is a trade-off between performance and cost-effectiveness when dealing with electromigration.